JPS5940870U - 半導体装置の測定用コンタクタ - Google Patents
半導体装置の測定用コンタクタInfo
- Publication number
- JPS5940870U JPS5940870U JP13487782U JP13487782U JPS5940870U JP S5940870 U JPS5940870 U JP S5940870U JP 13487782 U JP13487782 U JP 13487782U JP 13487782 U JP13487782 U JP 13487782U JP S5940870 U JPS5940870 U JP S5940870U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- contact pin
- contactor
- bracket
- test board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13487782U JPS5940870U (ja) | 1982-09-07 | 1982-09-07 | 半導体装置の測定用コンタクタ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13487782U JPS5940870U (ja) | 1982-09-07 | 1982-09-07 | 半導体装置の測定用コンタクタ |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5940870U true JPS5940870U (ja) | 1984-03-15 |
JPS6247096Y2 JPS6247096Y2 (en]) | 1987-12-24 |
Family
ID=30303781
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13487782U Granted JPS5940870U (ja) | 1982-09-07 | 1982-09-07 | 半導体装置の測定用コンタクタ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5940870U (en]) |
-
1982
- 1982-09-07 JP JP13487782U patent/JPS5940870U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6247096Y2 (en]) | 1987-12-24 |
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